ANALYSIS OPTIMIZATION AND CHARACTERIZATION OF ATOMIC FORCE MICROSCOPY (AFM) IMAGES USING A GRAPHICAL INTERFACE IN MATLAB

Published in 12/12/2023 - ISBN: 978-65-272-0088-8

Paper Title
ANALYSIS OPTIMIZATION AND CHARACTERIZATION OF ATOMIC FORCE MICROSCOPY (AFM) IMAGES USING A GRAPHICAL INTERFACE IN MATLAB
Authors
  • João Guilherme Vaz Duarte
  • Guilherme Severino Mendes de Araújo
  • Maria Leticia Vega
  • Angel Alberto Hidalgo
Modality
Pôster
Subject area
Dispositivos eletrônicos e ópticos (OLED/OFET/OPVs/etc.)
Publishing Date
12/12/2023
Country of Publishing
Brasil
Language of Publishing
Inglês
Paper Page
https://www.even3.com.br/anais/workshop-do-ineo-2023/613380-analysis-optimization-and-characterization-of-atomic-force-microscopy-(afm)-images-using-a-graphical-interface-in
ISBN
978-65-272-0088-8
Keywords
Atomic Force Microscopy (AFM), MATLAB, Surface characterization, Graphical User Interface (GUI)
Summary
Progress in science is impossible without reliable tools for the characterization of structural, physical and chemical properties of materials and devices at the micro, nano and atomic scale levels[1]. Atomic Force Microscopy (AFM) and its different modes of operation are a versatile tool that allows obtaining information of surface morphology and topography along with mapping of charge distribution, local electronic properties, among other properties at a high spatial resolution[2]. The connection between the morphological and topographical properties of films is critical for their application as components in optoelectronic devices. A large amount of information can be obtained from AFM images, however the programs available for the analysis of these images do not give clear explanations of how these parameters are obtained. MATLAB (Matrix Laboratory) is a programming language developed by MathWorks[3] . Due to be a programming and numerical computing language, MATLAB becomes an extremely useful tool for manipulating matrices, plotting functions and data, and creating program interfaces [3]. The AFM software can export a file for the measured line profiles, which can be opened and read by MATLAB code[4]. Surface structure quantification can be performed using different order statistics. It is possible to extract values such as roughness and height distribution. Among the most important features is the power spectrum density, which allows the fractal surface behavior to be determined. This fractality is interesting whenever the surface to volume ratio is an important parameter. On the other hand, MATLAB offers a base of mathematical operations, such as Fourier Transform (FT), calculation of correlations, matrix reading, among other operations of interest in the analysis of surfaces. In this sense, we are developing a graphical user interface (GUI) in MATLAB to improve the analysis of AFM images, plotting and storing in an automated way the topographic structure and mapping of electrical and mechanical properties at the nano scale. At the moment we have the capability for 3D imaging, roughness analysis, 1D-PSD calculation which compares well with commercial programs. These analyses will be applied to thin oxide films, memory devices and transistors. Acknowledgments: INEO, CNPQ, UFPI, CAPES, FINEP, FAPEPI. [1] The Use of Power Spectrum Density for Surface Characterization of Thin Films Fredrick Madaraka Mwema1,*, Esther Titilayo Akinlabi1 and Oluseyi Philip Oladijo DOI: 10.1002/9781119580546.ch9. [2] Advances in Atomic Force Microscopy for Probing Polymer Structure and Properties Dong Wang*,† and Thomas P. Russell Macromolecules 2018, 51, 3-24. [3] MATHWORKS. Matlab: Overview. <https://www.mathworks.com/products/matlab.html> Acessado em: 16/01/2023. [4] SARNEY, Wendy L. Using MATLAB to Calculate Parameters from Data Collected by Atomic Force Microscopy. DEVCOM Army Research Laboratory, 2022.
Title of the Event
Workshop do INEO 2023
City of the Event
Nazaré Paulista
Title of the Proceedings of the event
Anais do Workshop INEO 2023
Name of the Publisher
Even3
Means of Dissemination
Meio Digital

How to cite

DUARTE, João Guilherme Vaz et al.. ANALYSIS OPTIMIZATION AND CHARACTERIZATION OF ATOMIC FORCE MICROSCOPY (AFM) IMAGES USING A GRAPHICAL INTERFACE IN MATLAB.. In: Anais do workshop INEO 2023. Anais...Nazaré Paulista(SP) Hotel Estância Atibainha, 2023. Available in: https//www.even3.com.br/anais/workshop-do-ineo-2023/613380-ANALYSIS-OPTIMIZATION-AND-CHARACTERIZATION-OF-ATOMIC-FORCE-MICROSCOPY-(AFM)-IMAGES-USING-A-GRAPHICAL-INTERFACE-IN. Access in: 07/06/2025

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