EDMR ON A CHIP: HIGH-SENSITIVITY SPIN-DEPENDENT TRANSPORT ANALYSIS FOR NEXT-GENERATION SEMICONDUCTORS

Lucas Fattori de Moraes; Pedro Luis Mainardi Forti da Silva; Lucas Fugikawa Santos

Todos os Trabalhos

Trabalho

Título do Trabalho

EDMR ON A CHIP: HIGH-SENSITIVITY SPIN-DEPENDENT TRANSPORT ANALYSIS FOR NEXT-GENERATION SEMICONDUCTORS

Autores

Lucas Fattori de Moraes
Pedro Luis Mainardi Forti da Silva
Lucas Fugikawa Santos

Modalidade

Pôster - resumo

Área temática

Dispositivos eletrônicos, eletroquímicos, supercapacitores e baterias

Data de Publicação

27/05/2026

País da Publicação

Brasil

Idioma da Publicação

pt-BR

Página do Trabalho

https://www.even3.com.br/anais/workshop-do-ineo-2026/1462504-edmr-on-a-chip--high-sensitivity-spin-dependent-transport-analysis-for-next-generation-semiconductors

ISBN

978-65-272-2467-9

Palavras-Chave

Electron Paramagnetic Resonance, Electrically Detected Magnetic Resonance on a Chip, Paramagnetic defects, Semiconducting metal oxides, Organic semiconductors

Resumo

Departamento de Física, Universidade Estadual Paulista – UNESP, Rio Claro, SP. Semiconducting metal oxides (SMOs) and organic semiconductors have emerged as leading candidates due to their remarkable electronic and optical properties, compatibility with sustainable technologies, and potential for low-cost manufacturing [1]. Despite these advantages, their performance and stability remain constrained by atomic-scale paramagnetic defects and their dynamic interactions with environmental factors such as oxygen and water [2]. These mechanisms are not yet fully understood, creating a critical knowledge gap that limits the optimization of next-generation sensors and electronic devices [2]. To address this challenge, this research introduces Electrically Detected Magnetic Resonance (EDMR) on a Chip (EDMRoC) as a cutting-edge characterization technique [3]. Conventional Electron Paramagnetic Resonance (EPR) has long been used to identify defects in semiconductors, but its sensitivity is insufficient for thin films, and its geometry restricts in-operando analysis. EDMR, by contrast, detects changes in electrical transport directly linked to spin-dependent recombination processes, offering sensitivity several orders of magnitude higher than EPR. EDMRoC advances this approach by integrating microwave sources and detectors into micro-coils on a silicon chip, enabling frequency sweeps under static magnetic fields. This compact design minimizes noise from magnetic-field modulation, enabling real-time defect monitoring in operational devices. Using lock-in amplifiers with phase-sensitive detection, EDMRoC can measure extremely small signals, filtering out unwanted noise and isolating resonance-induced current variations. The methodology combines spin-resonance physics with electrical transport analysis. In EPR, unpaired electron spins absorb microwave radiation at resonance, and defects are identified through their characteristic Landé g-factor, which serves as a fingerprint of the local electronic environment. EDMR builds on this principle by monitoring current variations rather than absorption, so that when spins flip under resonance, the recombination rates of charge carriers change, producing measurable electrical signals. EDMRoC miniaturizes this setup, enabling in-operando analysis of thin-film devices with unprecedented sensitivity. By correlating spin transitions with dynamic current responses, the technique reveals how atomic-scale defects and adsorbed molecules such as oxygen and water modulate electronic transport. We aim to apply the developed EDMR-on-chip setup to characterize thin-film transistors (TFTs) based on SMOs and semiconducting polymers, thereby validating the technique. At the moment, we have developed all the needed electronics and magnetic field setup, as well as the needed calibration steps, which will be presented, and the challenges and experimental limitations will be discussed. Acknowledgement to INEO, FAPESP (2025/27044-5), and CNPq (408449/2024-1). References: [1] KAPLAN, D.; SOLOMON, I.; MOTT, N. F. Spin-dependent recombination processes. Journal of Physics, v. 35, p. 301–322, 1978. [2] LIPS, Klaus; et al. Spin-dependent recombination in amorphous silicon solar cells studied by EDMR. Physical Review B, v. 63, p. 125–134, 2001. [3] ANDERS, Jens; et al. Electrically detected magnetic resonance on a chip (EDMRoC): A novel platform for spin-dependent transport studies. Applied Physics Letters, v. 110, n. 12, p. 123–129, 2017.

Título do Evento: Workshop do INEO 2026
Cidade do Evento: Nazaré Paulista
Título dos Anais do Evento: Anais do Workshop do INEO 2026
Nome da Editora: Even3
Meio de Divulgação: Meio Digital

Como citar

MORAES, Lucas Fattori de; SILVA, Pedro Luis Mainardi Forti da; SANTOS, Lucas Fugikawa. EDMR ON A CHIP: HIGH-SENSITIVITY SPIN-DEPENDENT TRANSPORT ANALYSIS FOR NEXT-GENERATION SEMICONDUCTORS.. In: Anais do Workshop do INEO 2026. Anais...Nazaré Paulista(SP) Hotel Estância Atibainha, 2026. Disponível em: https//www.even3.com.br/anais/workshop-do-ineo-2026/1462504-EDMR-ON-A-CHIP--HIGH-SENSITIVITY-SPIN-DEPENDENT-TRANSPORT-ANALYSIS-FOR-NEXT-GENERATION-SEMICONDUCTORS. Acesso em: 10/08/2026